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X-ray emission spectroscopy of Ta-related oxides

Yoneda, Yasuhiro   ; Yoshii, Kenji  ; Suzuki, Chikashi 

We performed X-ray Emission spectroscopy (XES) by using a double crystal spectrometer. Ta-L$$_{alpha 1}$$ and L$$_{alpha 2}$$ emission lines of Ta-related materials of Ta-metal, Ta$$_2$$O$$_5$$, LiTaO$$_3$$, and KTaO$$_3$$ were measured. XES is one of the most important spectroscopies to make a remarkable progress utilizing third generation synchrotron radiation sources. Here, I discuss some aspects of XES in Ta compounds of recent experimental data. We also discuss an azimuth dependence of resonant X-ray emission spectra (RXES) of a single-crystal KTaO$$_3$$. The precise measurement by the double crystal spectrometer has observed change of the electronic structure by crystal orientation. Since electronic structure observation is a local probe, it can detect minute lattice deformation.

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