Angle dispersive X-ray diffraction measurements for synthetic studies using multi-anvil press

Saito, Hiroyuki; Endo, Naruki; Machida, Akihiko; Katayama, Yoshinori; Aoki, Katsutoshi

Recently, we have developed an in situ X-ray diffraction measurement system in the angle dispersive mode for synthetic studies using a cubic-type multi-anvil press. The angle dispersive method, which allows collection of whole Debye rings, provides information on the size of crystal grains and the process of crystal growth. Although the limited apertures for the incident and diffracted X-rays make it difficult to obtain X-ray diffraction profiles in the angle dispersive mode, acquired data set is useful to clarify reaction mechanism and synthetic process. The obtained information is useful not only for further synthetic study but also for basic science.