Cu-K edge RIXS study of charge excitations in La $_{2-x}$ (Sr,Ba) $_{x}$ CuO $_{4}$

Wakimoto, Shuichi ; Ishii, Kenji; Kimura, Hiroyuki*; Ikeuchi, Kazuhiko*; Yoshida, Masahiro*; Adachi, Tadashi*; Koike, Yoji*; Fujita, Masaki*; Yamada, Kazuyoshi*; Mizuki, Junichiro

We performed resonant inelastic X-ray scattering at Cu-K absorption edge to study charge excitations in hole-doped high-Tc cuprate La $_{2-x}$ (Sr,Ba) $_{x}$ CuO $_{4}$ . By subtracting elastic and molecular orbital excitation components from RIXS spectra, we have found dispersing charge excitation below 4 eV. This is the first success of observation of intra-band excitation which reflects dynamical charge-charge correlation function in the hole-doped system.

Language	:	Japanese
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Meeting title	:	日本物理学会2012年秋季大会(物性)
Held date	:	2012/09
Location (city)	:	横浜
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	SPring-8(大型放射光施設)
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Registration No. : BB20121750
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Cu-K edge RIXS study of charge excitations in La(Sr,Ba)CuO

Cu-K edge RIXS study of charge excitations in La $_{2-x}$ (Sr,Ba) $_{x}$ CuO $_{4}$