Thickness dependence of secondary-electron yield from carbon foils bombarded with 62.5-300-keV/u H $_{2}$ $^{+}$ and C $_{2}$ $^{+}$ ions

Narumi, Kazumasa; Takahashi, Yasuyuki*; Chiba, Atsuya; Saito, Yuichi; Yamada, Keisuke; Ishikawa, Norito ; Sugai, Hiroyuki*; Maeda, Yoshihito

no abstracts in English

Language	:	English
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Meeting title	:	8th International Symposium on Swift Heavy Ions in Matter (SHIM 2012)
Held date	:	2012/10
Location (city)	:	Kyoto
Location (country)	:	Japan
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Research Facility	:	TIARA(イオン照射研究施設)
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Registration No. : BB20122758
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Thickness dependence of secondary-electron yield from carbon foils bombarded with 62.5-300-keV/u H and C ions

Thickness dependence of secondary-electron yield from carbon foils bombarded with 62.5-300-keV/u H $_{2}$ $^{+}$ and C $_{2}$ $^{+}$ ions