Demonstration of up-conversion fluorescence from Ar clusters in intense free-electron-laser fields

Iwayama, Hiroshi*; Nagasono, Mitsuru*; Harries, J.; Shigemasa, Eiji*

Extreme ultraviolet (EUV) fluorescence emitted from Ar clusters irradiated by intense EUV free electron laser (FEL) pulses has been investigated. The EUV fluorescence spectra display rich structure at wavelengths shorter than the incident FEL wavelength of 51 nm. The results suggest that multiply-charged ions are produced following the ion-electron recombination processes which occur in the nanoplasma created by multi-photon excitation during the intense EUV-FEL pulses.

Language	:	English
Journal	:	Optics Express (Internet)
Volume	:	20
Number	:	21
Pages	:	p.23174 - 23179
Publication Year/Month	:	2012/10
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Paper URL	:	https://doi.org/10.1364/OE.20.023174
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Keywords	:	no keyword
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Registration No. : AA20120588
JAEA Abstracts No. : 41000321
Paper Submission No. : 11950

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