Characterization of diamond crystal by using confocal fluorescence microscope with a single defect as a probe

Onoda, Shinobu; Abe, Hiroshi; Yamamoto, Takashi; Oshima, Takeshi; Taniguchi, Takashi*; Teraji, Tokuyuki*; Siyushev, P.*; Tran, T. H.*; Yang, S.*; Fedder, H.*; Wrachtrup, J.*; Muller, C.*; McGuinness, L.*; Naydenov, B.*; Jelezko, F.*; Sumiya, Hitoshi*; Isoya, Junichi*

no abstracts in English

Language	:	Japanese
Journal	:
Volume	:
Number	:
Pages	:
Publication Year/Month	:
Meeting title	:	第26回ダイヤモンドシンポジウム
Held date	:	2012/11
Location (city)	:	東京
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	no keyword
Research Facility	:	電子加速器
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	筑波大学

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20122371
JAEA Abstracts No. :
Paper Submission No. :

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.