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THz tomography of photo-induced carrier based on pump-probe spectroscopy in counter-propagation geometry

Tsubouchi, Masaaki; Nagai, Masaya*; Oshima, Yasuhiro*

We have proposed a novel technique for the THz tomography of photo-induced carriers based on optical-pump THz-probe reflection spectroscopy with the counter-propagated pump and probe pulses. We have experimentally demonstrated it with silicon. The obtained complex reflection can be reproduced by the exact solution of Maxwell's equations.

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