Phase retrieval from a sparse scattering pattern for single molecular structural analysis

Kono, Hidetoshi; Ikeda, Shiro*

A new strong, short-pulse and coherent X-ray light source, which has been built at SPring8, is expected to achieve a single molecular imaging. With this 109 times brighter light than that of the current synchrotrons, we have to measure the diffraction within a few femto-second before the molecule is destroyed due to the radiation damage. Thus, the obtained diffraction pattern will be very sparse. We have recently developed a phase retrieval method based on the Bayesian statistics that is applicable for such a sparse diffraction pattern. In this article, we introduce the method.