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Resonant inelastic X-ray scattering study of intraband charge excitations in hole-doped high-$$T_c$$ cuprates

Wakimoto, Shuichi  ; Ishii, Kenji; Kimura, Hiroyuki*; Ikeuchi, Kazuhiko*; Yoshida, Masahiro*; Adachi, Tadashi*; Casa, D.*; Fujita, Masaki*; Fukunaga, Yasushi*; Gog, T.*; Koike, Yoji*; Mizuki, Junichiro; Yamada, Kazuyoshi*

We have performed resonant inelastic X-ray scattering (RIXS) near the Cu-$$K$$ edge on various cuprate superconductors, covering underdoped to heavily overdoped regimes and focusing on charge excitations inside the charge-transfer gap. RIXS measurements with $$E_i$$= 9.003 keV on metallic La$$_{1.7}$$Sr$$_{0.3}$$CuO$$_{4}$$ and Bi$$_{1.76}$$Pb$$_{0.35}$$Sr$$_{1.89}$$CuO$$_{6+delta}$$ exhibit a dispersive intraband excitation below 4 eV, similar to that observed in the electron-doped Nd$$_{1.85}$$Ce$$_{0.15}$$CuO$$_{4}$$. This is the first observation of a dispersive intraband excitation in a hole-doped system, evidencing that both electron- and hole-doped systems have a similar dynamical charge correlation function.



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Category:Materials Science, Multidisciplinary



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