Harada, Hiroyuki 
; Yamamoto, Kazami 
; Kato, Shinichi*
Residual gas Ionization Profile Monitors (IPMs) are used in the J-PARC 3-GeV RCS for the observation of circulating transverse beam profile. In IPM system, the ions and electrons produced by the beam passing through chamber lead to Micro Channel Plate (MCP) by the external electric field, and the signals from the MCP are observed as the beam profile. The IPM system was performed an upgrade plan for the optimization of the electric fields and the observation of beam profile by the elections. This will be reported the status of upgraded IPM.
Language |
: | English |
|---|---|---|
Journal |
: | Proceedings of 4th International Particle Accelerator Conference (IPAC '13) (Internet) |
Volume |
: | |
Number |
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Pages |
: | p.515 - 517 |
Publication Year/Month |
: | 2014/07 |
Meeting title |
: | 4th International Particle Accelerator Conference (IPAC '13) |
Held date |
: | 2013/05 |
Location (city) |
: | Shanghai |
Location (country) |
: | China |
Paper URL |
: |
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Keywords |
: | no keyword |
Research Facility |
: |
Accesses |
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- Accesses |
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