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Continuous observation of polarization effects in thin SC-CVD diamond detector designed for heavy ion microbeam measurement

Kada, Wataru*; Iwamoto, Naoya; Sato, Takahiro; Onoda, Shinobu; Grilj, V.*; Skukan, N.*; Koka, Masashi; Oshima, Takeshi; Jak$v{s}$i$'c$, M.*; Kamiya, Tomihiro

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Category:Instruments & Instrumentation

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