Refine your search�ソスF     
Report No.

Dependence of soft error rate in SOI SRAM on generated charge under buried oxide by high energy ion probes

Hazama, Masatoshi*; Abo, Satoshi*; Wakaya, Fujio*; Makino, Takahiro; Onoda, Shinobu; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

no abstracts in English



- Accesses





[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.