Defects in HPSI 4H-SiC studied by alpha particles induced charge transient spectroscopy

Iwamoto, Naoya; Fujita, Natsuko ; Makino, Takahiro; Onoda, Shinobu; Oshima, Takeshi

no abstracts in English

Language	:	Japanese
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Meeting title	:	2013年秋季第74回応用物理学会学術講演会
Held date	:	2013/09
Location (city)	:	京田辺
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Registration No. : BB20131671
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