Relationship between domain fluctuation and dielectric constant in relaxor ferroelectrics PZN-9%PT studied by coherent X-ray scattering

Owada, Kenji; Namikawa, Kazumichi*; Matsushita, Mitsuyoshi*; Mizuki, Junichiro*

It is generally known that the temperature dependence of the dielectric constants of relaxor ferroelectrics near morphotropic phase boundary (MPB) shows a cooling-rate dependence. This is due to a domain fluctuation across a tetragonal-to-rhombohedral phase transition. In this paper, we focus on the tetragonal-to-rhombohedral phase transition (T300 K) in relaxor ferroelectrics PZN-9%PT, which is very close to MPB. We have simultaneously measured the frequency-dependent dielectric constants and the coherent X-ray scattering directly reflecting a domain configuration. The results directly show an effect of the domain fluctuation on a low-frequency dielectric permittivity. These results should strongly relates to the cooling-rate dependence on the temperature dependence of the dielectric constants.