Color centers in diamond and SiC; From ensemble to single-defect measurements

Isoya, Junichi*; Teraji, Tokuyuki*; Yamamoto, Takashi*; Taniguchi, Takashi*; Watanabe, Kenji*; Koizumi, Satoshi*; Onoda, Shinobu; Abe, Hiroshi; Oshima, Takeshi; Umeda, Takahide*; Sumiya, Hitoshi*

no abstracts in English

Language	:	Japanese
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Meeting title	:	SiC及び関連半導体研究第22回SiC講演会
Held date	:	2013/12
Location (city)	:	さいたま
Location (country)	:	日本
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Keywords	:	no keyword
Research Facility	:	TIARA(イオン照射研究施設)
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Cooperating Institute	:	筑波大学

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Registration No. : BB20132442
JAEA Abstracts No. :
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