X-ray characterization of operand condition in soft X-ray region

Honda, Mitsunori   ; Yanagida, Masatoshi*; Han, L.*; Miyano, Kenjiro*

We are developing for new XAFS system under operand condition in soft X-ray regions. Recently, we performed X-ray measurments and we have get S K-edge NEXAFS spectra under operand conditions. In this study, one of the result from this system, we performed X-ray measurements to elucidate the adsorption mode of Ru complex (N719) molecules on nanoporous TiO under operand conditions. Two conditions, near-edge X-ray absorption fine structure spectroscopy, were employed in order to obtain depth profile information about the substrate. In both cases, we found that the S K-edge of Ru complex (N719) strongly interact with TiO via S atoms when the Ru complex is adsorbed from a single-component solution. In contrast, S-substrate interaction is strongly suppressed when D131 is coadsorbed with N719, indicating that the presence of D131 changes the adsorption mode of N719. Based on this finding, we successfully obtained the XAFS spectra under operand conditions in soft X-ray regions.