Polarized neutron reflectometry for magnetic thin layers in Japan

日本における磁性薄膜研究のための偏極中性子反射率計

武田 全康  

Takeda, Masayasu

Recently, more than 30 neutron reflectometers have been constructed at neutron experimental facilities all over the world. Furthermore, the number of the neutron reflectometer is still increasing, and it is not exceptional to have more than one neutron reflectometer at one facility. This is because the neutron reflectometry is ideal and nondestructive technique to analyze structures of surface and interface where new physical phenomena are expected to emerge. Such interface is very important for nanotechnology because it has a close relation to the practical devices which are indispensable to our daily life. In this talk, we will report the outline design specification, and the basic performance of the new neutron reflectometer SHARAKU installed at J-PARC as a state of the art polarized neutron reflectometer.