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Radiation response of fill-factor for GaAs solar cells with InGaAs quantum dot layers

Nakamura, Tetsuya*; Sumita, Taishi*; Imaizumi, Mitsuru*; Sugaya, Takeyoshi*; Matsubara, Koji*; Niki, Shigeru*; Mochizuki, Toru*; Takeda, Akihiro*; Okano, Yoshinobu*; Sato, Shinichiro; Oshima, Takeshi

Radiation effects on GaAs solar cells with InGaAs dot layers were investigated in order to consider the capability of them for space applications. The GaAs solar cells with 50 InGaAs dot layers and also GaAs solar cells with no dot layer were fabricated using a MBE method. They were irradiated with 150 keV-protons at room temperature. As a result, solar cell with dot layers showed higher radiation degradation in short circuit current however, lower degradation in open circuit voltage. Since no significant difference in the degradation of current - voltage characteristics under dark conditions between dot and non-dot solar cells, it is concluded that the degradation of fill fuctor does not come from the degradation of pn diode characteristics but might come from the degradation of minority carrier diffusion length.

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