Measurement of transient photo-induced changes in thin films at J-PARC; Time-resolved neutron reflectivity measurements of silver photo-diffusion into Ge-chalcogenide films

Sakaguchi, Yoshifumi*; Asaoka, Hidehito  ; Uozumi, Yuki; Kawakita, Yukinobu  ; Ito, Takayoshi*; Kubota, Masato ; Yamazaki, Dai  ; Soyama, Kazuhiko  ; Ailavajhala, M.*; Wolf, K.*; Mitkova, M.*; Skoda, M. W. A.*

We report recent results of time-resolved neutron reflectivity measurements for silver photo-diffusion into GeS (x=0.20, 0.33, 0.40) films performed on BL17 (SHARAKU). It is well known that silver diffuses into Ge-chalcogenide layer by visible light exposure with a distinct diffusion front, where the silver concentration abruptly drops off. Using an event recording system at the Materials and Life Science Experimental Facility, neutron reflectivity profiles were collected with a time-resolution of 30 seconds in the shortest case. It was found from the measurements that a relatively stable Ag-rich phase in the reaction layer is firstly formed, and then, slower diffusion occurs at the interface between Ag-rich and Ag-poor layers. Fourier transform analysis showed that the position of the interface is essentially fixed. This result is in contrast to the previously reported model of silver diffusion that postulates a mechanism involving progression of the diffusion front. The results of the measurements on Ag/Ge-Se films performed on the INTER instrument at ISIS are also reported.