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Orientation effect of organic semiconducting polymer revealed using Photo-Electron Emission Microscope (PEEM)

Sekiguchi, Tetsuhiro ; Baba, Yuji ; Shimoyama, Iwao  ; Hirao, Norie; Honda, Mitsunori  ; Izumi, Toshinori; Ikeura, Hiromi*

The molecular orientation is one of the important factors for controlling various properties in organic semiconductor materials. Films are usually heterogeneous. Thus they exist as a mixture of microscopic domains which have a variety of orientation directions. Therefore, it is essential to observe selectively microscopic domains with different orientation direction. In this work, we have developed the photoelectron emission microscope (PEEM) system combined with the linearly polarized vacuum ultraviolet (VUV) light or synchrotron radiation (SR) X-rays. PEEM images for poly(3-hexylthiophene), P3HT thin films were observed under synchrotron X-ray irradiation with linearly polarization. In conclusion, it was found that PEEM with polarized synchrotron can be a powerful tool that gives information of molecular orientation in nano-meter scale.

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