Simulation of runaway electron confinement in presence of macroscopic MHD modes

Yagi, Masatoshi; Matsuyama, Akinobu; Nuga, Hideo; Wakasa, Arimitsu*; Fukuyama, Atsushi*

no abstracts in English

Language	:	Japanese
Journal	:
Volume	:
Number	:
Pages	:
Publication Year/Month	:
Meeting title	:	プラズマシミュレータシンポジウム2014
Held date	:	2014/09
Location (city)	:	土岐
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	逃走電子; ディスラプション; テアリングモード; 放射損失; ストキャスティシティ
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20141658
JAEA Abstracts No. :
Paper Submission No. :

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.