Refine your search:     
Report No.
 - 

Soft error rate analysis based on multiple sensitive volume model using PHITS

Abe, Shinichiro; Sato, Tatsuhiko

Secondary cosmic-ray neutron-induced soft errors have been recognized as a serious problem affecting the reliability of microelectronic devices. Our developed Multi-scale Monte Carlo simulator called PHYSERD is a reliable code for analysis of soft error. However, PHYSERD takes long computational time to calculate processes of collecting charges because event-by-event technology computer-aided design (TCAD) simulation is time consuming. In this study, the multiple sensitive volume (MSV) model is adopted to estimate collected charge. Secondary cosmic-ray neutron-induced soft errors in an NMOSFET are analyzed based on the MSV model using PHITS. The results are compared with those obtained by PHYSERD based on event-by-event TCAD simulation and by single sensitive volume (SSV) model using PHITS. It is found that PHITS+MSV provides approximate SERs in a shorter time than PHYSERD. Furthermore, PHITS+MSV reproduces SERs and collected charges more accurately than PHITS+SSV by considering the spatial dependence of the charge collection efficiencies.

Accesses

:

- Accesses

InCites™

:

Percentile:42.29

Category:Nuclear Science & Technology

Altmetrics

:

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.