Refine your search:     
Report No.

Measurement of noble gas impurities in xenon dark matter detectors using resonance ionization mass spectrometry

Iwata, Yoshihiro   ; Sekiya, Hiroyuki*; Ito, Chikara   

no abstracts in English



- Accesses





[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.