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Evaluation of DNA damage induced by Auger electrons from $$^{137}$$Cs

Watanabe, Ritsuko; Hattori, Yuya; Kai, Takeshi   

To understand the effect of internal exposure of $$^{137}$$Cs, we focus on estimation of microscopic energy deposition pattern and DNA damage induced by directly emitted electrons (beta-rays, internal conversion electrons, Auger electrons) from $$^{137}$$Cs. Monte Carlo track simulation method was used to calculate the microscopic energy deposition pattern. To simulate the energy deposition by directly emitted electrons, we considered the multiple ejections of electrons after internal conversion. Induction process of DNA strand breaks and base lesions was modeled and simulated using Monte Carlo methods for cell mimetic condition. The yield and spatial distribution of simple and complex DNA damage were calculated for the cases of $$gamma$$-rays and electrons from $$^{137}$$Cs. The simulation showed that significant difference of DNA damage spectrum was not caused by the difference between secondary electron spectrum by $$gamma$$-rays and directly ejected electron spectrum. The result support that the existing evaluation that internal exposure and external exposure are almost equivalent.

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Category:Biology

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