Oriented organic semiconductors revealed using photo-electron emission microscopy with linearly polarized light and X-rays

Sekiguchi, Tetsuhiro ; Honda, Mitsunori ; Hirao, Norie; Ikeura, Hiromi*

We combine both the mercury lamp and synchrotron X-rays as excitation source of the photoelectron emission microscopy (PEEM) to investigate the orientation effect of organic semiconductors. We report on the oriented thin films of poly(3-hexylthiophene), P3HT, prepared on Si(001) wafers. Using the PEEM with linearly polarized synchrotron X-rays, excitation-energy dependence of photo-absorption (near-edge X-ray-absorption fine-structure, NEXAFS) in microscopic domains is analyzed from observed images. Symmetry of electronic transitions and orientation of molecules are revealed.

Language	:	English
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Meeting title	:	8th International Conference on Molecular Electronics and Bioelectronics (M&BE-8)
Held date	:	2015/06
Location (city)	:	Tokyo
Location (country)	:	Japan
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Keywords	:	放射光X線; X線吸収端微細構造; 偏光依存性
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Registration No. : BB20150978
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