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Enhanced charge excitations in electron-doped cuprates by resonant inelastic X-ray scattering

Toyama, Takami*; Tsutsui, Kenji; Mori, Michiyasu ; Sota, Shigetoshi*; Yunoki, Seiji*

Resonant inelastic X-ray scattering (RIXS) tuned for Cu $$L$$ edge is a possible tool to detect charge excitations in cuprate superconductors. We theoretically investigate the possibility for observing a collective charge excitation by the RIXS. The RIXS process via the intermediate state inevitably makes the spectral weight of charge excitation stronger in electron doping than in hole doping. Electron-hole asymmetry also appears in dynamical charge structure factor, showing a new enhanced small-momentum low-energy mode in electron doping. These facts indicate a possibility of detecting the new charge mode by RIXS in electron-doped systems.

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Category:Materials Science, Multidisciplinary

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