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Effects of muon interactions with matter on terrestrial muon-induced soft errors

Abe, Shinichiro  ; Sato, Tatsuhiko  ; Matsuba, Hirotaka*; Watanabe, Yukinobu*

Secondary cosmic-rays have been recognized as a cause of soft errors for microelectronics in terrestrial environment. Recently, the contribution of terrestrial muons to soft errors is concerned for advanced microelectronics because it becomes small and sensitive to radiation. Muons generate energetic secondary through photonuclear interaction and negative muon capture. In the present work, we investigate the effect of these interactions on terrestrial muon-induced soft errors. The analysis of soft error rate (SER) in the 25-nm design rule NMOSFET is performed based on the multiple sensitive volume (MSV) model using PHITS. It is clarified that the terrestrial muon-induced SER is a few or less of neutron-induced SER and it is mainly caused though negative muon capture while the effect of muon photonuclear interaction is small. It is also found that direct ionization only affects soft errors with extremely low critical charge.

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