Investigation of deep levels in diamond based radiation detector by transient charge spectroscopy with focused heavy ion microbeam

Ando, Yushi*; Kambayashi, Yuya*; Kada, Wataru*; Onoda, Shinobu; Makino, Takahiro; Sato, Shinichiro; Umezawa, Hitoshi*; Mokuno, Yoshiaki*; Shikata, Shinichi*; Hanaizumi, Osamu*; Kamiya, Tomihiro; Oshima, Takeshi

A transient spectroscopy analysis of pulse signals induced by heavy ion micro probe was applied for chemical vapor deposition (CVD) diamond-based radiation detector to investigate the effects of native defects in on the degradation of charge collection efficiency. A high-purity CVD diamond with thickness of 100 m was employed for the analysis, and as a result, a defect with activation energy of 0.27 eV which is involved in the degradation of CCE was detected.

Language	:	English
Journal	:
Volume	:
Number	:
Pages	:
Publication Year/Month	:
Meeting title	:	2015 International Conference on Solid State Devices and Materials (SSDM 2015)
Held date	:	2015/09
Location (city)	:	Sapporo
Location (country)	:	Japan
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	ダイヤモンド; 放射線検出器; 重イオンマイクロビーム
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	群馬大学

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20151467
JAEA Abstracts No. :
Paper Submission No. :

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.