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Nondestructive elemental depth-profiling analysis by muonic X-ray measurement

Ninomiya, Kazuhiko*; Kubo, Kenya*; Nagatomo, Takashi*; Higemoto, Wataru; Ito, Takashi; Kawamura, Naritoshi*; Strasser, P.*; Shimomura, Koichiro*; Miyake, Yasuhiro*; Suzuki, Takao*; Kobayashi, Yoshio*; Sakamoto, Shinichi; Shinohara, Atsushi*; Saito, Tsutomu*

Elemental analysis of materials is fundamentally important to science and technology. Many elemental analysis methods have been developed, but three-dimensional nondestructive elemental analysis of bulk materials has remained elusive. Recently, we developed a nondestructive depth-profiling elemental analysis method after a decade of research. This new method utilizes a new type of probe; a negative muon particle and high-energy muonic X-rays emitted after the muon stops in a material. We performed elemental depth profiling on an old Japanese gold coin (Tempo-Koban) using a low-momentum negative muon beam and successfully determined that the Au concentration in the coin gradually decreased with depth over a micrometer length scale.

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Category:Chemistry, Analytical

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