Advancement of -spectrometry with Ge semiconductor detectors for the analysis of environmental soil samples

Saegusa, Jun; Maeda, Satoshi; Kurita, Yoshiyuki; Yoda, Tomoyuki; Takeishi, Minoru

no abstracts in English

Language	:	Japanese
Journal	:
Volume	:
Number	:
Pages	:
Publication Year/Month	:
Meeting title	:	原子力機構研究成果報告会; ふくしまの環境回復に係るこれまでの取組
Held date	:	2015/11
Location (city)	:	福島
Location (country)	:	日本
Patent information	:
PDF	:
Paper URL	:	https://fukushima.jaea.go.jp/fukushima/result/pdf/pdf1511/1-4r.pdf
DOI for research data	:
Keywords	:	福島第一原子力発電所事故; 放射能分析; Ge半導体検出器; ISO/IEC17025; Fukushima Daiichi Nuclear Power Station Accident
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : BB20153000
JAEA Abstracts No. :
Paper Submission No. :

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.