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Rapid measurement scheme for texture in cubic metallic materials using time-of-flight neutron diffraction at iMATERIA

Onuki, Yusuke*; Hoshikawa, Akinori*; Sato, Shigeo*; Xu, P. G. ; Ishigaki, Toru*; Saito, Yoichi*; Todoroki, Hidekazu*; Hayashi, Makoto*

The authors have developed texture measurement system on a time-of flight neutron diffractometer, iMATERIA (BL20, MLF/J-PARC, Japan). Quantitative Rietveld texture analysis for a duplex stainless steel was possible with one neutron beam exposure for several minutes without sample rotation. The minimum number of diffraction spectra required for the Rietveld texture analysis was experimentally determined as $$sim$$100. The suggested rapid measurement scheme used 132 spectra and determined volume fractions of texture components in both ferrite and austenite phases, quantitatively. This quantitative and rapid measurement scheme was established by utilizing the features of iMATERIA as a powder diffractometer, i.e. fairly high resolution in d-spacing and numerous detectors equipped in a wide range of scattering angle.

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Category:Chemistry, Multidisciplinary

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