Irradiation test of semiconductor components on the shelf for nuclear robots based on Fukushima Accidents

Kawatsuma, Shinji; Nakai, Koji; Suzuki, Yoshiharu; Kase, Takeshi 

Radiation Tolerance of semiconductor components on the shelf, utilized on the robots for emergency response or decommissioning in nuclear facilities, should be estimated. Just after the Fukushima Daiichi NPPs accidents occurred, a guideline, of irradiation tolerance estimation and management method of semiconductor components on the shelf, was tried to be made based on the old database developed in the course of Bilateral Servo Manipulator under the high radiation and high contamination environments. The estimation was conservative, because the data in the database were old and mainly based on the test results of silicon semiconductors. Ga-As Semiconductors are coming major recently, and expected to be higher radiation tolerance. For those reason, present semiconductor devices have irradiated and the irradiation tolerance have estimated.