Chemical correlation analysis between different elements probed by imaging XAFS technique

Okamoto, Yoshihiro ; Nagai, Takayuki ; Kobayashi, Hiromi*; Hatakeyama, Kiyoshi*; Shiwaku, Hideaki

Chemical correlation analysis between different elements in the simulated nuclear waste glass samples was performed by using imaging XAFS technique. We have used this new technique in the study of chemical behavior of platinoid elements in the borosilicate nuclear waste glass. In the present study, the simulated nuclear waste glass prepared by several kinds of conditions were analyzed by the imaging XAFS technique.

Language	:	Japanese
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Meeting title	:	2016年度量子ビームサイエンスフェスタ; 第8回MLFシンポジウム/第34回PFシンポジウム
Held date	:	2017/03
Location (city)	:	つくば
Location (country)	:	日本
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Keywords	:	XAFS; Borosilicate Glass; Imaging; Synchrotron Radiation; High-level Radioactive Wastes
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Registration No. : BB20161863
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