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Implementing displacement damage calculations for electrons and $$gamma$$ rays in the Particle and Heavy-Ion Transport code System

Iwamoto, Yosuke   

In this study, the Monte Carlo displacement damage calculation method in the Particle and Heavy-Ion Transport code System (PHITS) was improved to calculate displacements per atom (DPA) due to irradiation by electrons and $$gamma$$ rays. For the damage due to electrons and $$gamma$$ rays, PHITS simulates electromagnetic cascades using the EGS5 algorithm and calculates DPA values using the recoil energies. A comparison of DPA values calculated by PHITS and the Monte Carlo assisted Classical Method (MCCM) reveals that they were in good agreement for $$gamma$$-ray irradiations of silicon and iron at energies that were less than 10 MeV. Above 10 MeV, PHITS can calculate DPA values not only for electrons but also for charged particles produced by photonuclear reactions. For irradiation of 90-cm-thick carbon by protons with energies of more than 30 GeV, the ratio of the secondary electron DPA values to the total DPA values is more than 10% and increases with an increase in incident energy.

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Category:Instruments & Instrumentation

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