Development of spin contrast variation neutron reflectometry

Kumada, Takayuki   ; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Sahara, Masae*; Suzuki, Junichi*; Torikai, Naoya*

We have developed a technique of spin contrast variation neutron reflectometry (SCV-NR). The reflectivity curve of the polarized neutrons nonsimilarly varies as a function of proton polarization PH of a polymer thin film on silicon substrate. The PH-dependent reflectivity curve determines the roughnesses of the surface and interface of the polymer thin film, whereas single reflection curve of non-polarized neutrons cannot determine uniquely. We consider that the SCV-NR would be a promising technique to determine surface and interface structure of thin films of soft materials.