Development of spin-contrast-variation neutron reflectometry for the structural analysis of multilayer films

Kumada, Takayuki   ; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Sahara, Masae*; Suzuki, Junichi*; Torikai, Naoya*

We developed a technique of spin-contrast-variation neutron reflectometry (SCV-NR). Polarized-neutron reflectivity curves of film samples vary as a function of their proton-polarization P. The P-dependent reflectivity curves of a polystyrene film was precisely reproduced using a common set of structure parameters and the P-dependent neutron scattering length. The reflectivity curve of poly (styrene-block-isoprene) (PSPI) presented a shoulder attributed to holes with the depth corresponding to one period of periodic lamellae on the free surface only at a specific P. In this way, structural information about specific surfaces or interfaces can be obtained by controlling the P.