XAFS measurement of simulated waste glass samples prepared from borosilicate glass frit including phosphorus pentaoxide (Joint research)

Nagai, Takayuki  ; Kobayashi, Hidekazu ; Shimamura, Keisuke; Oyama, Koichi ; Sasage, Kenichi; Okamoto, Yoshihiro  ; Shiwaku, Hideaki   ; Yamanaka, Keisuke*; Ota, Toshiaki*

Addition of radioactive waste to a borosilicate glass frit affects the local structures of glass-forming elements and waste elements in a waste glass produced in a vitrification process. In this study, simulated waste glass samples were prepared from borosilicate glass frit including phosphorus pentaoxide, and we investigated local structures of sodium (Na), boron (B), and waste elements in these glass samples by using synchrotron XAFS measurements in soft and hard X ray region.