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Characterization of pinning center in Zr-doped (Gd,Y)Ba$$_{2}$$Cu$$_{3}$$O$$_{x}$$ superconductor tape by anomalous small-angle X-ray scattering

Oba, Yojiro  ; Sasaki, Hirokazu*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Onuma, Masato*

Since pinning centers are closely related to the physical properties in Zr-doped (Gd,Y)Ba$$_{2}$$Cu$$_{3}$$O$$_{x}$$ superconductor tapes, the accurate characterization of the pinning centers is required. Although small-angle X-ray scattering (SAXS) is suitable for this purpose, weak scattering contrast between (Gd,Y)Ba$$_{2}$$Cu$$_{3}$$O$$_{x}$$ matrix and BaZrO$$_{3}$$ pinning center is a problem. Therefore, anomalous small-angle X-ray scattering (ASAXS) at Zr K absorption edge was performed. Since Zr is concentrated in only the pinning center, the scattering of the pinning center is enhanced. As the result, we successfully observed the scattering of the pinning centers in the Zr-doped (Gd,Y)Ba$$_{2}$$Cu$$_{3}$$O$$_{x}$$ tapes. The detail of the nanostructures of the pinning centers is discussed.

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