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Crystal structures of highly hole-doped layered perovskite nickelate Pr$$_{2-x}$$Sr$$_{x}$$NiO$$_{4}$$ studied by neutron diffraction

Kajimoto, Ryoichi  ; Nakajima, Kenji  ; Fujita, Masaki*; Ishikado, Motoyuki*; Torii, Shuki*; Ishikawa, Yoshihisa*; Miao, P.*; Kamiyama, Takashi*

A high-resolution time-of-flight powder neutron diffraction study of the layered nickel oxide Pr$$_{2-x}$$Sr$$_{x}$$NiO$$_{4}$$ with $$x = 0.7$$ and $$0.9$$ was performed to characterize the crystal structures of these highly hole-doped nickelates. For the sample with $$x = 0.7$$, the Ni-O bond lengths decrease uniformly with decreasing temperature, and the atomic displacement parameters are similar to those for $$x = 1/3$$. In contrast, for the sample with $$x = 0.9$$, the out-of-plane Ni-O bond length shows a sharp thermal contraction in the high-temperature region, which is suggestive of changes in the orbital occupation accompanied by the development of checkerboard-type charge correlations. Furthermore, the $$x = 0.9$$ sample is characterized by a large atomic displacement parameter for the apical O atoms along the out-of-plane direction, which is interpreted as the existence of two types of Ni$$^{3+}$$ sites with different orbital occupancies. The distinct difference between the $$x = 0.9$$ sample and the lower-concentration compounds should be related to the development of checkerboard-type charge ordering in the metallic matrix and possible orbital ordering at the Ni$$^{3+}$$ sites at $$x sim 1$$ in the hole-doped layered nickel oxides.



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Category:Physics, Multidisciplinary



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