XAFS analysis of simulated radioactive waste glass prepared by bottom drain test

Okamoto, Yoshihiro  ; Nagai, Takayuki  ; Kobayashi, Hiromi*; Homma, Masanobu*; Hatakeyama, Kiyoshi*; Hirono, Kazuya*; Shiwaku, Hideaki   

The chemical state of some elements contained in the simulated waste glass samples prepared by bottom drain test using a small furnace was investigated by synchrotron XAFS analysis. The effect of gas bubbling in the molten state and the effect of waste loading rate variation (2030wt%) were evaluated from the results of XAFS analysis of each element. As a result of XAFS analysis, the tendency to become oxidative due to high waste loading rate and to become reductive by bubbling with reducing gas was recognized. On the other hand, it was found that they are classified into elements that are affected and those that are not affected. The bubbling operation has been tested in an actual plant, and these results are expected to provide meaningful information for the operation.