Study of adsorption and diffusion of cesium atoms in C solid by depth analysis with photo-electron spectroscopy

Sekiguchi, Tetsuhiro  ; Yokoyama, Keiichi  ; Yano, Masahiro   ; Asaoka, Hidehito  ; Suzuki, Shinichi*; Yaita, Tsuyoshi

In the recovery process for the laser isotope separation of cesium Cs-135, we need occlusion material that takes the photo-generated atomic Cs selectively, but does not take CsI molecules. In the present study, fullerene C was selected as an occlusion material. Concentration depth distribution of Cs in the solid was evaluated using X-ray photo-electron spectroscopy (XPS). The dependence of the X-ray excitation energy for Cs or CsI dosed C samples were measured. Difference in excitation energy dependence were observed between Cs and CsI. In Cs, the results were explained by the distribution that penetrated deeply into the solid. On the other hand, it was concluded that CsI did not penetrate into the solid.