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Irradiation effects of swift heavy ions detected by refractive index depth profiling

Amekura, Hiroshi*; Li, R.*; Okubo, Nariaki; Ishikawa, Norito; Chen, F.*

Evolution of depth profiles of the refractive index in Y$$_{3}$$Al$$_{5}$$O$$_{12}$$ (YAG) crystals were studied under 200 MeV Xe ion irradiation. The index changes were observed at three different depth regions; (i) a plateau near the surface between 0 and 3 $$mu$$m in depth, which can be ascribed to the electronic stopping Se, (ii) a broad peak at 6 $$mu$$m in depth, and (iii) a sharp dip at 13 $$mu$$m in depth, which is attributed to the nuclear stopping Sn peak.



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