Irradiation effects of swift heavy ions detected by refractive index depth profiling

Amekura, Hiroshi*; Li, R.*; Okubo, Nariaki ; Ishikawa, Norito ; Chen, F.*

Evolution of depth profiles of the refractive index in Y $_{3}$ Al $_{5}$ O $_{12}$ (YAG) crystals were studied under 200 MeV Xe ion irradiation. The index changes were observed at three different depth regions; (i) a plateau near the surface between 0 and 3 m in depth, which can be ascribed to the electronic stopping Se, (ii) a broad peak at 6 m in depth, and (iii) a sharp dip at 13 m in depth, which is attributed to the nuclear stopping Sn peak.

Language	:	English
Journal	:	Quantum Beam Science (Internet)
Volume	:	4
Number	:	4
Pages	:	p.39_1 - 39_11
Publication Year/Month	:	2020/12
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Paper URL	:	https://doi.org/10.3390/qubs4040039
DOI for research data	:
Keywords	:	イオン照射
Research Facility	:	タンデム加速器
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Registration No. : AA20200845
JAEA Abstracts No. : 49000446
Paper Submission No. : 24006

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