Characterization of precipitated phase in Cu-Ni-Si alloy by small angle X-ray scattering, small angle neutron scattering and atom probe tomography

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro ; Onuma, Masato*; Giddings, A. D.*; Okubo, Tadakatsu*

no abstracts in English

Language	:	Japanese
Journal	:	Do To Dogokin
Volume	:	60
Number	:	1
Pages	:	p.309 - 314
Publication Year/Month	:	2021/08
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Paper URL	:	https://doi.org/10.34562/jic.60.1_309
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Keywords	:	no keyword
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Registration No. : AA20200840
JAEA Abstracts No. : 50000069
Paper Submission No. : 24889

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