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Quantitative X-ray diffraction analysis of solute-enriched stacking faults in $$hcp$$-Mg alloys based on peak asymmetry analysis

Egusa, Daisuke*; Manabe, Ryo*; Kawasaki, Takuro   ; Harjo, S.   ; Sato, Shigeo*; Abe, Eiji*

Based on X-ray diffraction analysis we attempt to quantify a volume fraction of stacking faults, which are essentially enriched by solute elements (solute-enriched stacking faults; SESFs) in Mg-Zn-Gd alloys with a hexagonal-close-packed ($$hcp$$) structure. We find that the SESFs with a local face-center-cubic stacking mostly occurs as a limited thickness less than several unit-cell dimensions, causing anisotropic broadening of the diffraction peaks including $$c*$$-component. By dealing the SESFs as intergrowth-like precipitates, we have successfully decomposed the asymmetric peak profile into the $$hcp$$-matrix and the SESF peaks, by which the relevant volume fractions can be estimated in a highly quantitative manner.

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Category:Materials Science, Multidisciplinary

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