Depth concentration profiles for cesium compounds in fullerene absorbent investigated with X-ray energy dependence in photoelectron spectroscopy

Sekiguchi, Tetsuhiro  ; Yokoyama, Keiichi  ; Yaita, Tsuyoshi

The isotope separation of cesium-135 (Cs), 2.3 million years lived nuclide in fission products, is an important issue for the transmutation annihilation. Fullerene Co has been candidated as an absorbent for selective storage materials in order to avoid collision induced isotope exchange between Cs atoms and CsI molecules. In this study, we investigated depth concentration distributions of Cs atom or CsI in Co by electron emission angle-resolved, photon-energy dependent, and Ar-sputtering time dependent X-ray photoelectron spectroscopy (XPS) with synchrotron-radiation. Here we present on excitation energy dependence of XPS for Cs and CsI dosed on thick Co (50 nm) films deposited on Si substrates. Assuming models, we simulated the photoelectron intensity to find the most probable depth distribution.