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Cu $$K$$-edge X-ray absorption fine structure study of $$T'$$-type $$RE$$$$_{2}$$CuO$$_{4+alpha-delta}$$ ($$RE$$ = Rare Earth); Toward unified understanding of electronic state of $$T'$$-type cuprate

Chen, Y.*; Asano, Shun*; Wang, T.*; Xie, P.*; Kitayama, Shinnosuke*; Ishii, Kenji*; Matsumura, Daiju   ; Tsuji, Takuya  ; Taniguchi, Takanori*; Fujita, Masaki*

To investigate the variation of the electronic state of $$T'$$-type cuprate due to annealing, we performed Cu $$K$$-edge X-ray absorption fine structure measurements on Pr$$_{2}$$CuO$$_{4+alpha-delta}$$ (PCO) and Pr$$_{1.3}$$La$$_{0.7}$$CuO$$_{4+alpha-delta}$$ (PLCO). The induced electrons due to annealing ($$n_{AN}$$) in PCO and PLCO were approximately 2$$delta$$, consistent with a model of electron doping to Mott insulator. Here, $$alpha$$ and $$delta$$ represent the amount of excess oxygen from the stoichiometric composition in the as-sintered compound and that of oxygen loss due to annealing, respectively. Furthermore, the energy of the Einstein oscillator ($$hbaromega_{E}$$) for the Cu-O$$_{p}$$ bond was evaluated by extended X-ray absorption fine structure analysis. (O$$_{p}$$ denotes the in-plane oxygen.) We found a small annealing effect on $$hbaromega_{E}$$ for both PCO and PLCO.

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