Simulation of cosmic ray induced soft errors using PHITS

Abe, Shinichiro

Non-destructive faults (the so-called soft errors) in microelectronics caused by cosmic rays have been recognized as a serious reliability problem. To guarantee the reliability of microelectronic devices, it is necessary to evaluate the soft error rate. We have developed some technics for the soft error simulation using PHITS code. We have also developed the terrestrial SER estimation methodology based on simulation coupled with one-time neutron irradiation testing. These results will be reported as the explanatory article in the journal of CROSS T&T published by the Comprehensive Research Organization for Science and Society (CROSS).

Language	:	Japanese
Journal	:	CROSS T&T
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Number	:	76
Pages	:	p.39 - 43
Publication Year/Month	:	2024/02
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Paper URL	:	https://www.cross.or.jp/tsukuba/reference/cross-tt
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Keywords	:	ソフトエラー; 中性子; ミューオン; モンテカルロシミュレーション; PHITS; HyENEXSS
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Registration No. : AA20230782
JAEA Abstracts No. : 52000745
Paper Submission No. : 28159

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