Development of remote analysis technology using microchip laser for accident reactor decommissioning

Oba, Hironori ; Wakaida, Ikuo ; Taira, Takunori*

no abstracts in English

Language	:	Japanese
Journal	:	Sumato Purosesu Gakkai-Shi
Volume	:	13
Number	:	2
Pages	:	p.51 - 58
Publication Year/Month	:	2024/03
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Keywords	:	Fukushima Daiichi Nuclear Power Station Accident; 福島第一原子力発電所事故; レーザー誘起ブレークダウン分光; 遠隔分析; マイクロチップレーザー; 放射線環境下
Research Facility	:	ウラン濃縮研究棟
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Registration No. : AA20230909
JAEA Abstracts No. : 52000755
Paper Submission No. : 28172

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