Jo, Sadaharu*; Suzuki, Seiya; Yoshimura, Masamichi*
The surface morphology of naphtacene single crystals grown by the physical vapor transport technique was investigated by atomic force microscopy and white-beam X-ray topography. Locally, two types of line pattern were observed on the basal (001) plane along the [110] and [010] directions, and analyzed from crystallographic viewpoints. Such line patterns are considered in relation to crystallographic periodicities, dislocation lines, and slip-plane phenomena.
発表言語 |
: | English |
|---|---|---|
掲載資料名 |
: | |
巻 |
: | 63 |
号 |
: | 6 |
ページ数 |
: | p.065503_1 - 065503_4 |
発行年月 |
: | 2024/06 |
キーワード |
: | no keyword |
論文URL |
: |
|
|---|---|---|
論文解説 |
: |
Access |
: |
- Accesses |
|---|---|---|
InCites™ |
: |
パーセンタイル：0.00 分野：Physics, Applied |
Altmetrics |
: |
[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.
