Structural investigation of borosilicate glasses by using XAFS measurement in soft X-ray region, 4 (Joint research)

Nagai, Takayuki  ; Okamoto, Yoshihiro  ; Shibata, Daisuke*; Kojima, Kazuo*; Hasegawa, Takehiko*; Sato, Seiichi*; Fukaya, Akane*; Hatakeyama, Kiyoshi*

XAFS measurements in the soft X-ray region are suitable for evaluating the chemical state of the surface layer of a measurement sample because the X-ray transmittance is low. In this study, the purpose of the study was to confirm the difference between the coagulated surface layer and the inside of the simulated waste glasses by measuring the K-edge of the glass constituent elements boron, oxygen, sodium, and silicon, and the L edge of the waste component cerium. As a result, the B K-edge XANES spectra showed that the proportion of B-O tetracoordinate sp structures (BO) on the surface layer of the coagulated glass samples was higher than that on the cut surface inside the glass samples, which is expected to improve the water resistance of the coagulated surface. On the other hand, the O K-edge XANES spectra suggested that the O abundance in the coagulated surface layer was lower than that in the cut surface inside the glass samples, and that alkali metal elements may be concentrated in the coagulated surface layer. However, no difference was observed in the Na K-edge XANES spectra between the coagulated surface layer and the cut surface, and no difference was observed in the Si K-edge XANES spectra between the solidified surface and the inside of glass samples. In addition, the Ce L-edge XANES spectra confirmed that the Ce valence in the surface layer of coagulated glass samples were oxidized compared to the inside of glass samples.